AFM invented by Binning and co-workers in 1986. 
        Belongs to the Scanning Probe Microscopy family
                                         Binning et al., Physics Review Letters 1986
                      AFM invented by Binning and co-workers in 1986. 
                      Belongs to the Scanning Probe Microscopy family
           AFM, atomic force microscopy [1]
                                                                                            PFM, Piezoresponse Force Microscopy[16]
                   Contact AFM                                                              PSTM, photon scanning tunneling microscopy[17]
                   Non-contact AFM                                                          PTMS, photothermal microspectroscopy/microscopy
                   Dynamic contact AFM                                                      SCM, scanning capacitance microscopy[18]
                   Tapping AFM                                                              SECM, scanning electrochemical microscopy
           BEEM, ballistic electron emission microscopy[2]
                                                                                            SGM, scanning gate microscopy[19]
           CFM, chemical force microscopy                                                   SHPM, scanning Hall probe microscopy[20]
           C-AFM, conductive atomic force microscopy[3]
                                                                                            SICM, scanning ion-conductance microscopy[21]
           ECSTM electrochemical scanning tunneling microscope[4]
                                                                                            SPSM spin polarized scanning tunneling microscopy[22]
           EFM, electrostatic force microscopy[5]
           FluidFM, Fluidic force microscopy[6][7][8][9]                                    SSM, scanning SQUID microscopy
                                                                                            SSRM, scanning spreading resistance microscopy[23]
           FMM, force modulation microscopy[10]
                                                                                            SThM, scanning thermal microscopy[24]
           FOSPM, feature-oriented scanning probe microscopy[11]
                                                                                            STM, scanning tunneling microscopy[25]
           KPFM, kelvin probe force microscopy[12]
                                                                                            STP, scanning tunneling potentiometry[26]
           MFM, magnetic force microscopy[13]
                                                                                            SVM, scanning voltage microscopy[27]
           MRFM, magnetic resonance force microscopy[14]
                                                                                            SXSTM, synchrotron x-ray scanning tunneling microscopy[28]
           NSOM, near-field scanning optical microscopy (or SNOM, scanning                  SSET Scanning Single-Electron Transistor Microscopy [29]
           near-field optical microscopy)[15]
             (Wikipedia 2015)                                                                                     Binning et al., Physics Review Letters 1986
         PRINCIPLE  Physical probe that raster scans a specimen
                                        Key elements:
                                        1. Probe
                                        2. Detector & Feedback
                                        3. Piezo actuators
        http://ssd.phys.strath.ac.uk/index.php/Scanning_tunnelling_luminescence
        Scanning Probe Microscopy
     Scanning Tunneling Microscopy (STM)
     Atomic Force Microscopy (AFM)  
     Operate by using a small tip (the probe) to scan very closely across a surface, 
     detecting forces present between the surface and the tip.
     Atomic scale resolution possible 
     Can be operated in air and liquid
     Slow
                                                            STM
                                                            STM
            Allows:
                To see (1981)                To manipulate (1988)
      •
         Signal origin is quantum tunneling effect
      •
         0.1 nm lateral resolution and 0.01 nm depth 
      resolution
      •
        Can be used to manipulate individual atoms, trigger 
      chemical reactions, or reversibly produce ions by 
      removing or adding individual electrons from atoms or                               Image of reconstruction on
                                                                                           a clean Au(100) surface. 
      molecules.
      •
         Very small scan ranges
                                                                                   STM image of self-assembled 
                                                      http://en.wikipedia.org/     supramolecular chains of the organic 
                                                                                   semiconductor Quinacridone on Graphite.